Events 2026

On this page you will find a list of upcoming or ongoing events in which Fraunhofer IOSB's Department Visual Inspection Systems (SPR) is involved or which we organize ourselves.

You can access past events via the links in the blue box, right.

We invite you to join us - we would be delighted to meet you at one of these events!

This conference is a leading event organized by the IEEE Industrial Electronics Society (IES), with the goal of bringing together the international professional community to present the latest research findings, exchange new ideas and technical breakthroughs, and discuss current challenges and future developments in the fields of technology and innovation.

Felix Kronenwett is on the scene with a report:

Line-Scan Sensors and Convolutional Neural Networks: Unified Modelling, Parameter Selection and Row-Wise Inference

He presents a mathematically consistent system model for the real-time processing of line-scan camera data using convolutional neural networks (CNNs) in industrial image processing, including precise latency and stability limits. By shifting line by line and reusing feature maps, only the image lines that have actually just arrived are recalculated. This efficient inference strategy yields mathematically identical results to those of classical batch processing.

The conference brings together two of Europe's leading photonics conferences – 𝗦𝗣𝗜𝗘 𝗘𝗻𝘃𝗶𝗿𝗼𝗻𝗺𝗲𝗻𝘁𝗮𝗹 𝗥𝗲𝗺𝗼𝘁𝗲 𝗦𝗲𝗻𝘀𝗶𝗻𝗴 and 𝗦𝗣𝗜𝗘 𝗦𝗲𝗰𝘂𝗿𝗶𝘁𝘆 + 𝗗𝗲𝗳𝗲𝗻𝗰𝗲. 
With a total of 17 technical conference topics, the event will showcase the latest sensor and photonics technologies for imaging and monitoring the Earth’s atmosphere and environment, as well as sensor technologies.

🗣️ We are represented by three entries:

End-to-end learning of screen pattern and network parameters for one-shot deflectometric surface inspection

Speaker: Meyer, Johannes  September 15, 2026, from 11:20 a.m. to 11:40 a.m. | Lowther
A new framework: significantly more robust and accurate defect detection, especially for complex geometries and fine defects.

Efficient mechanical-free acquisition of the bidirectional reflectance distribution function BRDF via computational illumination and sensing

Speaker: Meyer, Johannes September 15, 2026, from 11:40 a.m. to 12:00 p.m. | Lowther
This approach opens up new possibilities for material characterization, optical inspection, and realistic appearance capture.

Efficient primal-dual pattern generation for arbitrary light transport probing

Speaker: Dippon, Lukas September 15, 2026, from 4:40 p.m. to 5:00 p.m. | Lowther
High-resolution light patterns push the boundaries of optical material characterization. Higher resolution. More light. More insight.

👍Would you like to learn more? Read the abstracts; see the links in the box.

Image processing plays a key role in many areas of technology for fast and contactless data acquisition. For example, in the quality assurance of industrial production processes, in robotics and for driver assistance, image processing systems have gained an indispensable place. This development is supported by the availability of high-quality and inexpensive sensor systems, by the increase in the performance of computer systems, and by advances in the methodology for evaluating image data.

The "Image Processing forum" aims to report on current trends towards solutions in image processing and to contribute to the professional exchange between the participants.

Image Processing for Surfaces - Advances in technology not only enable ever higher inspection speeds and more compact systems, but also, in addition to the evaluation of two-dimensionally recorded textures, the complete recording of complex 3D surface structures down to the nanometer range. Furthermore, the rapid evaluation of colored, patterned, transparent, highly reflective or mirroring surfaces is possible. In the seminar, different inspection and analysis methods will be presented for this purpose.

This year, we are once again involved in the success of the event as co-organizers with lectures and workshops.