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VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft// Fraunhofer Institute of Optronics\, Sys
 tem Technologies and Image Exploitation IOSB //EN
BEGIN:VEVENT
UID:06360565-6f02-486e-a846-cb8afbccc20d
DTSTAMP:20260507T232756Z
SUMMARY:Seminar "Surface inspection"
DTSTART:20241126T230000Z
DTEND:20241127T230000Z
END:VEVENT
END:VCALENDAR